Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-To-Lot Variability (Classic Reprint) - Softcover
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Excerpt from Sequential Screening in Semiconductor Manufacturing I: Exploiting Lot-to-Lot Variability
Chips per wafer. According to Cunningham, the goal of most of the chip yield modelingresearch has been to predict costs and actual yields, and to determine the appropriate level of circuit integration. Albin and Friedman's (1989) work on acceptance sampling appears to be the first to employ a yield model in a quality control context; they use a two parameter distribution (the Neyman type A, which is a Poisson compounded Poisson) to model the number of defective chips on a wafer. Because they were interested in quality control issues rather than circuit design issues, they directly modeled the yield without.
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Sequential Screening in Semiconductor Manufacturing I (Classic Reprint)
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Paperback. Condition: New. Print on Demand. This book is a rigorous exploration into the practical application of queueing theory to semiconductor manufacturing. It focuses primarily on wafer fabrication, describing the problems faced in the facility and the mathematical tools that can be used to optimize production. The book acknowledges that previous yield models have not accounted for yield variability and spatial dependence, and develops new models to incorporate these factors into screening strategies. The author uses lot and wafer-level data collected from multiple semiconductor fabrication facilities to verify that screening can indeed lead to increased revenue. Operations researchers, industrial engineers, and researchers in the semiconductor manufacturing industry should appreciate the theoretical advancements and practical insights presented here. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9781332281473_0
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Sequential Screening in Semiconductor Manufacturing I Exploiting LottoLot Variability Classic Reprint
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9781332281473
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