Modern RF and Microwave Measurement Techniques (The Cambridge RF and Microwave Engineering Series) - Hardcover
Book 10 of 20: Cambridge RF and Microwave Engineering
Synopsis
A comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement, including practical advice on deployment challenges.
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About the Authors
Valeria Teppati is a Researcher in the Millimeter Wave Electronics Group of the Department of Information Technology and Electrical Engineering at ETH Zurich, developing innovative solutions to aspects of linear and non-linear measurement techniques.
Andrea Ferrero is a Professor in the RF, Microwave and Computational Electronics group of the Department of Electronics and Telecommunications at Politecnico di Torino. He is a Distinguished Microwave Lecturer of the IEEE Microwave Theory and Techniques Society, and a Fellow of the IEEE.
Mohamed Sayed is the Principal Consultant for Microwave and Millimeter Wave Solutions and has nearly 30 years' experience of developing microwave and millimetre wave systems for Hewlett-Packard Co. and Agilent Technologies Inc.
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Modern RF and Microwave Measurement Techniques (The Cambridge RF and Microwave Engineering Series)
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Hardcover. Condition: new. Hardcover. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines fundamental theory with in-depth analysis of advanced modern instrumentation, methods and systems, alongside practical advice for RF and microwave engineers and researchers. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9781107036413
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Hardback. Condition: New. This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analyzers, real-time spectrum analyzers and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and multiport measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail and accompanied by state-of-the-art solutions to the unique technical challenges associated with its use. With each chapter written by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements. Seller Inventory # LU-9781107036413
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