Applying the Rasch Model and Structural Equation Modeling to Higher Education: The Technology Satisfaction Model - Hardcover

Islam, A.Y.M. Atiquil

Hardcover

ISBN 10: 1032471409 ISBN 13: 9781032471402

Publisher: Chapman and Hall/CRC, 2023

Synopsis

This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and structural equation modeling (SEM) – a multivariate technique – to higher education (HE) research. User satisfaction is traditionally measured along a single dimension. However, the TSM includes digital technologies for teaching, learning and research across three dimensions: computer efficacy, perceived ease of use and perceived usefulness. Establishing relationships among these factors is a challenge. Although commonly used in psychology to trace relationships, Rasch and SEM approaches are rarely used in educational technology or library and information science. This book, therefore, shows that combining these two analytical tools offers researchers better options for measurement and generalisation in HE research. This title presents theoretical and methodological insights of use to researchers in HE.

About this title

About the Author

A.Y.M Atiquil Islam is Associate Professor in the Department of Education Information Technology at East China Normal University. He obtained a multidimensional PhD degree by combining two faculties, namely, Education and Computer Science & Information Technology from the University of Malaysia. His career has seen international collaboration on conducting quantitative research in higher education (including in USA, UK, Malaysia, China, Saudi Arabia, Oman, Philippine, Iraq, Algeria, Pakistan, and Bangladesh).

Edition details

• Publisher: Chapman and Hall/CRC
• Publication date: 2023
• Language: English
• ISBN 10: 1032471409
• ISBN 13: 9781032471402
• Binding: Hardcover
• Edition number: 1
• Number of pages: 148