This handbook presents the methods of particle sampling and analysis for those with limited experience in the field. The book begins with an overall discussion of terminology, units, properties, and particle behavior. Sampling methods and instruments are covered in a way that allows the reader to find the one best suited to the objectives of his/her study. This is facilitated through a detailed description of the methods that includes principles, special features of sample preparation, errors, and interferences. Specification sheets are provided for instruments that are commercially available. The final section of the book offers a tabular presentation of the major methods of particle analysis, including techniques such as X-ray fluorescence, electron micrscopy, and gas chromatography.
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