Seller: SUNSET BOOKS 2, Newark, OH, U.S.A.
Paperback. Condition: Very Good. No Jacket. 1st. With full markings, labels, pocket and stamps, clean text. Minor wear on edges/corners. Automated Inspection and Measurement - Volume 730, Proceedings of SPIE - The International Society for Optical Engineering, 28-30 October 1986, Cambridge, Massachusetts. Size: 4to. Ex-Library. Seller Inventory # 020080