This edition on optical document security has been revised and updated to include three new chapters on security design of valuable documents and products, smart card security, and biometrics. The book should be of interest to engineers and both technical and non-technical managers using secure documents or manufacturing security devices.
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Rudolf L. van Renesse graduated in Technical and Scientific Photography in the Hague, the Netherlands in 1965. He joined TNO Institute of Applied Physics in 1966 where he is currently active as a senior R&D scientist in the Optics Department.
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