Synopsis
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
"synopsis" may belong to another edition of this title.
Synopsis
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought about by new technologies are also covered. Acidi
About the Author
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
Hakim, U.S. Army LABCOM, Fort Monmouth, New Jersey.
"About this title" may belong to another edition of this title.
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Microelectronic Reliability Vol I Test and Diagnostics Reliability, Test and Diagnostics v 1 Materials science library
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Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)
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Microelectronic Reliability Vol I Test and Diagnostics Reliability, Test and Diagnostics v 1 Materials science library
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Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)
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Artech House Publishers, 1989
ISBN 10: 0890062846
ISBN 13: 9780890062845
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Microelectronic Reliability Vol. I: Test and Diagnostics
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Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)
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(Ipf)Microelectronic Reliability
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Artech House Publishers Jan 1989, 1989
ISBN 10: 0890062846
ISBN 13: 9780890062845
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Buch. Condition: Neu. Neuware - Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought. Seller Inventory # 9780890062845