Synopsis
Developments over the past six years have been covered in this expanded text, while previously covered topics have been revisited with a fresh perspective. New material includes fault isolation and characterization, as well as state-of-the-art techniques to analyze the die from the backside. This updated reference book, prepared by experts in their fields, contains 60 articles covering a wide range of topics involving the failure analysis of microelectronics. It places the most frequently needed information on this subject at your fingertips. Contents: Overall View of Failure Analysis of Microelectronic Devices Test-and-Fail Verification Decapsulation and Package Analysis Electrical Techniques Electron/ Ion-Beam Based Techniques Thermal Techniques Photonic Techniques Soft-ware Techniques Deprocessing and Sample Preparation Physical / Chemical Defect Characterization Discrete / Passive Component Analysis Failure Modes and Mechanisms Advance Techniques Laboratory Operations and Management.
"synopsis" may belong to another edition of this title.
Search results for Microelectronic Failure Analysis Desk Reference
Stock Image
Microelectronic Failure Analysis: Desk Reference
Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less. Seller Inventory # G0871706385I4N00
Stock Image
Microelectronic Failure Analysis: Desk Reference (#09105G)
Seller: HPB-Red, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_421253766
Seller Image
Microelectronic Failure Analysis: Desk Reference
Seller: -OnTimeBooks-, Phoenix, AZ, U.S.A.
Seller rating 5 out of 5 stars
Condition: very_good. Gently read. May have name of previous ownership, or ex-library edition. Binding tight; spine straight and smooth, with no creasing; covers clean and crisp. Minimal signs of handling or shelving. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships USPS Media Mail. Seller Inventory # OTV.0871706385.VG
Stock Image
Microelectronic Failure Analysis Desk Reference
Seller: Better World Books: West, Reno, NV, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Seller Inventory # 3586888-75
Stock Image
Microelectronic Failure Analysis: Desk Reference (#09105G)
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: New. In shrink wrap. Looks like an interesting title! Seller Inventory # Q-0871706385
Stock Image
Microelectronic Failure Analysis: Desk Reference Ross, Richard J.; Boit, Christian and Staab, Donald
Seller: Aragon Books Canada, OTTAWA, ON, Canada
Seller rating 3 out of 5 stars
Condition: New. Seller Inventory # DCBAK--0023