Items related to Microelectronic Failure Analysis Desk Reference
Synopsis
Developments over the past six years have been covered in this expanded text, while previously covered topics have been revisited with a fresh perspective. New material includes fault isolation and characterization, as well as state-of-the-art techniques to analyze the die from the backside. This updated reference book, prepared by experts in their fields, contains 60 articles covering a wide range of topics involving the failure analysis of microelectronics. It places the most frequently needed information on this subject at your fingertips. Contents: Overall View of Failure Analysis of Microelectronic Devices Test-and-Fail Verification Decapsulation and Package Analysis Electrical Techniques Electron/ Ion-Beam Based Techniques Thermal Techniques Photonic Techniques Soft-ware Techniques Deprocessing and Sample Preparation Physical / Chemical Defect Characterization Discrete / Passive Component Analysis Failure Modes and Mechanisms Advance Techniques Laboratory Operations and Management.
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Microelectronic Failure Analysis: Desk Reference Fourth Edition
Published by
ASM International, Materials Park, Ohio, 1999
ISBN 10: 0871706385
ISBN 13: 9780871706386
Used
Hardcover
Seller: Aspen Book Co., Denver, CO, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. Fourth Edition. The book is in good condition, with a sturdy hardcover binding. There are no visible inscriptions or library markings, ensuring its integrity as a personal or professional reference. The absence of a dust jacket description suggests it may not have one, or it is in a typical state for library or professional use. unknown (no dust jacket details provided). Seller Inventory # A10-B9-MRG-0364
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Microelectronic Failure Analysis Desk Reference
Seller: Better World Books: West, Reno, NV, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Former library copy. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Seller Inventory # 3586888-75
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Microelectronic Failure Analysis: Desk Reference (#09105G)
Seller: HPB-Red, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_421253766
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Microelectronic Failure Analysis: Desk Reference (#09105G)
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: New. In shrink wrap. Looks like an interesting title! Seller Inventory # Q-0871706385