Yield Modelling and Defect Tolerance in VLSI, Papers Presented at the INT Workshop on Designing for Yield, 1-3 July 1987, Oxford - Hardcover

Moore, Will; Maly, Wojciech

Hardcover

ISBN 10: 085274398X ISBN 13: 9780852743980

Publisher: CRC Press, 1988

Synopsis

Papers of the International Workshop on Designing for Yield, Oxford, July 1987. Objectives include discussion of topics in VLSI and designing integrated circuits to yield targets. On yield loss mechanisms and defect tolerance, alternative prospects, catastrophic yield loss models, parametric yield l

About this title

Synopsis

Papers of the International Workshop on Designing for Yield, Oxford, July 1987. Objectives include discussion of topics in VLSI and designing integrated circuits to yield targets. On yield loss mechanisms and defect tolerance, alternative prospects, catastrophic yield loss models, parametric yield loss, defect-tolerant architectures, yield predicti

Edition details

• Publisher: CRC Press
• Publication date: 1988
• Language: English
• ISBN 10: 085274398X
• ISBN 13: 9780852743980
• Binding: Hardcover
• Edition number: 1
• Number of pages: 304
• Editor: Strojwas Andrzej J.