Synopsis
"Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. "
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About the Author
Rene David is a Research Director at the Centre National de la recherche Scientififique working at the Instuit National Polytechnique de Grenoble, France.
"About this title" may belong to another edition of this title.
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Random Testing of Digital Circuits : Theory and Application
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Marcel Dekker Inc., New York, NY, U.S.A., 1998
ISBN 10: 0824701828
ISBN 13: 9780824701826
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Random Testing of Digital Circuits: Theory and Applications
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Random Testing of Digital Circuits : Theory and Applications
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Random Testing Of Digital Circuits: Theory And Applications
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Random Testing of Digital Circuits: Theory and Applications
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Random Testing of Digital Circuits : Theory & Application
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Random Testing of Digital Circuits : Theory & Application
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Random Testing of Digital Circuits
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