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Optical System Contamination: Effects, Measurements and Control VIII (Proceedings of SPIE) - Softcover
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Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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Optical System Contamination: Effects, Measurements and Control VIII (Proceedings of SPIE) [Paperback] Chen, Philip T and Johns, O.M. Uy
Published by
Society of Photo Optical, 2002
ISBN 10: 081944541X
ISBN 13: 9780819445414
Used
Softcover
Seller: Hay-on-Wye Booksellers, Hay-on-Wye, HEREF, United Kingdom
Seller rating 5 out of 5 stars
Condition: Very Good. shelfwear to edges of cover. Otherwise fine. Seller Inventory # 91326
Quantity: 1 available