Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst-this tutorial's intended reader.
"synopsis" may belong to another edition of this title.
Advances in solid state detector arrays, flat panel displays and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst - this tutorial's intended reader. In this book, Fourier transform theory is used to describe and quantify sampling artifacts such as display raster, blocky images, and the loss or alteration of image detail due to aliasing. The theory is used to predict the type and level of sampling artifacts expected for a particular sensor and display combination. The text also provides the metrics or rules needed to optimize the design of a sampled imager. Two appendices - addressing Fourier integrals and series and the impulse function - are useful references for the mathematics described in the main text.
"About this title" may belong to another edition of this title.
Seller: LIBRERÍA SOLÓN, Madrid, M, Spain
Tapa Blanda. Condition: Bien. Colección 'SPIE Tutorial Texts in Optical Engineering'. Rústica. Ilustrado.9780819434890. SPIE Publications. Estados Unidos. 2000. 25x18 centímetros. 176 páginas. Tapa blanda. Estado=Bien. Inglés. Seller Inventory # 44894