Synopsis
As the authoritative resource on optical scattering, this book was developed from many years of teaching light-scatter measurement and analysis courses to optical engineers. Dr. Stover covers scattering beginning with its basics and covering surface roughness calculations, measurements, instrumentation, predictions, specifications, and industrial applications. Also included are appendices that review the basics of wave propagation and Kirchhoff diffraction. Whether you're an optical engineer currently investigating roughness-induced haze in the semiconductor industry, or just entering the field of scatter metrology, this text will be invaluable. This is a softcover version of PM24.
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Synopsis
Developed from notes for teaching the fundamentals of light-scatter measurement and analysis to optical engineers at various conferences over several years, and first published in 1992 partly to help engineers attain the fast quality control being demanded in such high-volume industries as paper, steel, aluminum, and ceramics. In addition to a gene
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Optical Scattering: Measurement and Analysis (SPIE Press Monograph Vol. PM24)
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