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Papers from the 1997 IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems.
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1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems: October 20-22, 1997 Paris, France
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1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems: October 20-22, 1997 Paris, France. Proceedings
ISBN 10: 0818681683
ISBN 13: 9780818681684
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Softcover. Condition: Very Good. No Jacket. First Edition. Ex research library book. The covers look great. The binding is tight. The interior pages are clean and unmarked. Electronic delivery tracking will be issued free of charge. Seller Inventory # 09054
Quantity: 1 available