Synopsis
Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduces some common linear compactors, presents two definitions of aliasing probability, and discusses probabilistic fault models and their practical validity. No index. Annotation copyright Book News, Inc. Portland, Or.
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Synopsis
Synthesizes recent findings on the chance of missing a faulty circuit when the data from testing microelectronic systems is compacted to be more manageable, a situation known as aliasing. Considers single and multiple stuck-at, delay, and stuck-open faults. Also reviews the testing of VLSI, introduces some common linear compactors, presents two def
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