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Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15) - Hardcover
Book 37 of 40: Frontiers in Electronic Testing
Synopsis
Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
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Product Description
Design for AT-speed Test, Diagnosis and Measurement Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority! Seller Inventory # S_396544618
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Design for at-Speed Test, Diagnosis and Measurement
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Design for at-Speed Test, Diagnosis and Measurement
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Design for at-Speed Test, Diagnosis and Measurement
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
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Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear. Seller Inventory # GWSVV.0792386698.G
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Design for at-Speed Test, Diagnosis and Measurement
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Condition: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Seller Inventory # 14665342-20
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing)
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Hardcover. Condition: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire. Seller Inventory # SKU002982
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Design for AT-Speed Test, Diagnosis and Measurement: 15 (Frontiers in Electronic Testing, 15)
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1990 HC Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
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hardcover. Condition: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good. Seller Inventory # xc-bs36
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title! Seller Inventory # Q-0792386698