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Synopsis
This text constitutes the proceedings from the 5th IEEE International High Level Design, Validation and Test Workshop (HLDVT 2000), which took place in 2000. Topics covered include high level design validation, error models and verification tests, and on-chip software testing.
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IEEE International High-Level Design, Validation, and Test Workshop: 8-10 November 2000 Berkeley, California
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Condition: good. A copy that has been read, remains in good condition. All pages are intact, and the cover is intact. The spine and cover show signs of wear. Pages can include notes and highlighting and show signs of wear, and the copy can include "From the library of" labels or previous owner inscriptions. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships via media mail. Seller Inventory # OTV.0769507867.G