2000 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft 2000) - Softcover
Synopsis
This work constitutes the proceedings of the 2000 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2000). Subjects addressed include: yield analysis and modelling; wafer scale/large area systems; fault-tolerant systems; tesitng strategies; and more.
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2000 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft 2000)
Seller: D2D Books, Berkshire, United Kingdom
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Soft cover. Condition: As New. I.E.E.E.Press/ Computer Society 2000 paperback 422 pages full of statistics, minor shelfwear but this is A BRAND NEW BOOK UNUSED. Full refund if not satisfied. 24 hour despatch via Insured for. If not pictured in this listing, a scan of the actual book is available on request. Seller Inventory # tla2862a
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