RF-MEMS, or MEMS with radio-frequency functionality, were originally developed in the 1990s. Their characteristics in terms of low loss, high isolation and wide tunability were outstanding when compared both to standard RF/microwave components and to semiconductors. Such remarkable performance led many to expect a large adoption of RF-MEMS components in mass-market applications, especially mobile devices and handsets. This revolution was ultimately not realised. However, over the last few years, RF-MEMS have started to make their way into the market landscape, thanks to a need that other technologies were unable to address as effectively.
With the advent of modern 4th-generation (4G) smartphones, adaptive impedance tuners are now the first successful example of exploitation of RF-MEMS technology in the consumer market, and ahead of us lies the 5th-generation (5G) of mobile communications and services. 5G will demand an increase in data volume by a factor of 1000, as well as reduced End to End (E2E) latency, Massive Machine Communication (MMC) and operation in the millimetre wave range. RF-MEMS technology promises to be a key enabling solution for 5G. Indeed, 5G could be the killer application scenario for massive uptake of RF-MEMS in the mass-market landscape and offers a vast opportunity for RF-MEMS technology.
This book outlines the intrinsic potential of RF-MEMS technology with a specific focus on 5G mobile communications and services. Commencing with a review of the characteristics of RF-MEMS in relation to the specifications of interest for 5G, the book proceeds to develop practical insight concerning the design and development of RF-MEMS including case studies of design concepts. Including multiphysics simulation and animations, the book will be essential reading for both academic and industrial researchers and engineers.
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Jacopo Iannacci is Researcher in MEMS technology with the Center for Materials and Microsystems (CMM) at Fondazione Bruno Kessler (FBK) in Trento, Italy, since 2007. His scientific focuses are on (compact) modelling, design, optimisation, integration, packaging and testing for reliability of RF MEMS (Radio Frequency MicroElectroMechanical Systems) passive devices/networks, EH MEMS (Energy Harvesting MEMS), as well as SA MEMS (MEMS Sensors and Actuators).
He received the MSc Degree in Electronic Engineering (2003) from the University of Bologna, Italy, and the PhD in Information Technology (2007) from the ARCES Center of Excellence at the University of Bologna, Italy, with focus on mixed domain simulation and hybrid wafer level packaging of RF MEMS devices for wireless applications.
In 2005 and 2006, Jacopo Iannacci worked as Visiting Researcher at the DIMES Technology Center of the Technical University of Delft, the Netherlands, where he focused on development of packaging and integration solutions for RF MEMS devices. In 2016, he visited the Fraunhofer Institute for Reliability and Microintegration IZM in Berlin, Germany, as Seconded Researcher, studying the integration of RF MEMS devices and their optimisation against market requirements.
Jacopo Iannacci authored and co-authored numerous scientific contributions for international journals and conference proceedings, as well as books and several book chapters in the field of MEMS and RF MEMS technology.
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