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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 1997: 153 (Institute of Physics Conference) - Hardcover

Rodenburg, John M.

 
9780750304412: Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of ... 1997: 153 (Institute of Physics Conference)
Hardcover
ISBN 10: 0750304413 ISBN 13: 9780750304412
Publisher: CRC Press, 1997

Synopsis

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy (from P. Hawkes), the development of the scanning electron microscope at Cambridge (from K. Smith), electron energy loss spectroscopy (from L.M. Brown), imaging methods (from J. Spence), and the future of electron microscopy (from C. Humphreys). Covering a wide range of applications of advanced techniques, it discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume is a handy reference for professionals using microscopes in all areas of physics, materials science, metallurgy, and surface science to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.

"synopsis" may belong to another edition of this title.

About the Author

John M. Rodenburg

From the Back Cover

Electron Microscopy and Analysis 1997 celebrates the centenary anniversary of the discovery of the electron by J.J. Thomson in Cambridge and the fiftieth anniversary of this distinguished Institute group. The book includes papers on the early history of electron microscopy, the development of the scanning electron microscope at Cambridge, electron energy loss spectroscopy, imaging methods, and the future of electron microscopy. It discusses electron imaging, electron energy-loss and x-ray analysis, and scanning probe and electron beam microscopies. This volume enables you to gain an overview of developments in our understanding of materials microstructure and of advances in microscope interrogation techniques.

"About this title" may belong to another edition of this title.

Publisher
CRC Press
Publication date
1997
Language
English
ISBN 10 
0750304413
ISBN 13 
9780750304412
Binding
Hardcover
Edition number
1
Number of pages
708