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Diagnostics and Applications of Thin Films, Proceedings of the INT Summer School, May 1991, Czechoslovakia - Hardcover

 
9780750301657: Diagnostics and Applications of Thin Films, Proceedings of the INT Summer School, May 1991, Czechoslovakia

Synopsis

In an area of ever increasing interest, this volume comprises the invited papers from well known and respected workers in the field. It covers the characterization of thin films using a variety of techniques including scanning electron microscopy, scanning tunnelling microscopy, transmission electron microscopy, x-ray diffraction and electron probe microanalysis.
The main applications of this specialized field in sensors, hard coatings and microelectronics are discussed.

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Synopsis

The results of a summer school held in Czechoslovakia are contained in this volume, which explores the characterization of thin films using techniques such as scanning tunnelling microscopy, X-ray microanalysis and transmission electron microscopy, as well as specific applications of thin films, including hard coatings and sensors.

"About this title" may belong to another edition of this title.

  • PublisherCRC Press
  • Publication date1992
  • ISBN 10 0750301651
  • ISBN 13 9780750301657
  • BindingHardcover
  • LanguageEnglish
  • Edition number1
  • Number of pages328
  • EditorRuzicka T.

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Eckertova, L.
Published by Institute of Physics Publishing, 1992
ISBN 10: 0750301651 ISBN 13: 9780750301657
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Condition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. Außen: angestoßen. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. | Seiten: 328 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 42293857/202

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ISBN 10: 0750301651 ISBN 13: 9780750301657
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Eckertova, L.; Ruzicka, T.
ISBN 10: 0750301651 ISBN 13: 9780750301657
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Hard Cover. Condition: New. New condition. 314pp. Illustrated. Proceedings of the International Summer School May 27-June 5 1991, Czechoslovakia. Papers presented include the characterization of thin films using techniques such as scanning tunnelling microscopy, x-ray microanalysis, transmission electron microscopy, applications of thin films in coatings and sensors, industrial film thickness measurements and methods, SIMS of thin films, Fourier transform of lattices, structural surface measurements by backscattered electrons, EELS, and more. Seller Inventory # S12-000904

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