In an area of ever increasing interest, this volume comprises the invited papers from well known and respected workers in the field. It covers the characterization of thin films using a variety of techniques including scanning electron microscopy, scanning tunnelling microscopy, transmission electron microscopy, x-ray diffraction and electron probe microanalysis.
The main applications of this specialized field in sensors, hard coatings and microelectronics are discussed.
"synopsis" may belong to another edition of this title.
The results of a summer school held in Czechoslovakia are contained in this volume, which explores the characterization of thin films using techniques such as scanning tunnelling microscopy, X-ray microanalysis and transmission electron microscopy, as well as specific applications of thin films, including hard coatings and sensors.
"About this title" may belong to another edition of this title.
£ 7.49 shipping from Germany to United Kingdom
Destination, rates & speeds£ 31.56 shipping from U.S.A. to United Kingdom
Destination, rates & speedsSeller: Buchpark, Trebbin, Germany
Condition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. Außen: angestoßen. Aus der Auflösung einer renommierten Bibliothek. Kann Stempel beinhalten. | Seiten: 328 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 42293857/202
Quantity: 1 available
Seller: Bookmans, Tucson, AZ, U.S.A.
Hardcover. Condition: Good. Satisfaction 100% guaranteed. Seller Inventory # mon0001781287
Quantity: 1 available
Seller: Bingo Used Books, Vancouver, WA, U.S.A.
Hardcover. Condition: Near Fine. hardback in near fine condition. Seller Inventory # 125669
Quantity: 1 available
Seller: Book Booth, Berea, OH, U.S.A.
Hard Cover. Condition: New. New condition. 314pp. Illustrated. Proceedings of the International Summer School May 27-June 5 1991, Czechoslovakia. Papers presented include the characterization of thin films using techniques such as scanning tunnelling microscopy, x-ray microanalysis, transmission electron microscopy, applications of thin films in coatings and sensors, industrial film thickness measurements and methods, SIMS of thin films, Fourier transform of lattices, structural surface measurements by backscattered electrons, EELS, and more. Seller Inventory # S12-000904
Quantity: 1 available
Seller: dsmbooks, Liverpool, United Kingdom
Hardcover. Condition: Good. Good. book. Seller Inventory # D8S0-3-M-0750301651-3
Quantity: 1 available