International Conference on Advanced Phase Measurement Methods in Optics and Imaging: v. 1236 (AIP Conference Proceedings: Accelerators, Beams, and Instrumentations) - Softcover
Synopsis
Phase plays an important role in all branches of optics and imaging and in all wavelength ranges from x-ray to millimetre-waves. The key topics of the conference are therefore phase control and advanced phase measurements to stimulate discussion among different branches of metrology and to interlink several technical fields through their unifying feature: the phase.
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International Conference on Advanced Phase Measurement Methods in Optics and Imaging: Monte Verita, Ascona, Switzerland, 16-21 May 2010
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 494 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar. Seller Inventory # 7684806/12
International Edition
INTERNATIONAL CONFERENCE ON ADVANCED PHASE MEASUREMENT METHODS IN OPTICS AND IMAGING (PB 2010)
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AMERICAN INSTITUTE OF PHYSICS, 2010
ISBN 10: 0735407835
ISBN 13: 9780735407831
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