Excerpt from The Production of Elliptic Interferences in Relation to Interferometry, Vol. 2
In chapter X the equation derived in the preceding report (no. 149, chapter V) for the displacement of the center of ellipses produced by the opaque mirror on the micrometer is tested throughout the spectrum and for all angles Of incidence. This requires a knowledge of the indices of refraction Of the glass of the grating for all wave-lengths. A method of total reflection suitable to the case, where only a flat spicule of glass is at hand, was therefore developed and applied.
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780656195503
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