Items related to Focused Ion Beam Systems: Basics and Applications
Synopsis
This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology.
"synopsis" may belong to another edition of this title.
About the Author
NAN YAO holds several positions at Princeton University, New Jersey. He is director of the Imaging and Analysis Center; Senior Research Scholar at the Institute for the Science and Technology of Materials; and a lecturer in Mechanical and Aerospace Engineering.
"About this title" may belong to another edition of this title.
Search results for Focused Ion Beam Systems: Basics and Applications
Seller Image
Focused Ion Beam Systems : Basics and Applications
Published by
Cambridge University Press, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 5090824-n
Stock Image
Focused Ion Beam Systems: Basics and Applications
Published by
Cambridge University Press, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: California Books, Miami, FL, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # I-9780521831994
Stock Image
Focused Ion Beam Systems: Basics and Applications
Published by
Cambridge University Press, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In English. Seller Inventory # ria9780521831994_new
Buy New
£ 112.36
£ 11.29 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Stock Image
Focused Ion Beam Systems : Basics and Applications
Published by
Cambridge University Press, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 5090824-n
Buy New
£ 109.48
£ 15 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Stock Image
Focused Ion Beam Systems: Basics and Applications
Published by
Cambridge University Press, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
First Edition
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Editor(s): Nan, Yao. Num Pages: 408 pages, 196 b/w illus. BIC Classification: TBN; TGM; TJF. Category: (P) Professional & Vocational. Dimension: 180 x 252 x 29. Weight in Grams: 862. . 2007. 1st Edition. hardcover. . . . . Seller Inventory # V9780521831994
Buy New
£ 116.90
£ 8.14 shipping
Ships from Ireland to U.S.A.
Ships from Ireland to U.S.A.
Quantity: Over 20 available
Stock Image
Focused Ion Beam Systems: Basics and Applications
Published by
Cambridge University Press, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Seller Inventory # C9780521831994
Buy New
£ 110.07
£ 20.53 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Seller Image
Focused Ion Beam Systems
Published by
Cambridge University Press, GB, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Hardback. Condition: New. The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. Seller Inventory # LU-9780521831994
Buy New
£ 137.03
Free Shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: Over 20 available
Stock Image
Focused Ion Beam Systems (Hardcover)
Published by
Cambridge University Press, Cambridge, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
First Edition
Seller: CitiRetail, Stevenage, United Kingdom
Seller rating 5 out of 5 stars
Hardcover. Condition: new. Hardcover. The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9780521831994
Buy New
£ 109.49
£ 37 shipping
Ships from United Kingdom to U.S.A.
Ships from United Kingdom to U.S.A.
Quantity: 1 available
Stock Image
Focused Ion Beam Systems: Basics and Applications
Published by
Cambridge University Press, 2007
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Editor(s): Nan, Yao. Num Pages: 408 pages, 196 b/w illus. BIC Classification: TBN; TGM; TJF. Category: (P) Professional & Vocational. Dimension: 180 x 252 x 29. Weight in Grams: 862. . 2007. 1st Edition. hardcover. . . . . Books ship from the US and Ireland. Seller Inventory # V9780521831994
Seller Image
Focused Ion Beam Systems
Published by
Cambridge University Press, 2013
ISBN 10: 0521831997
ISBN 13: 9780521831994
New
Hardcover
Seller: moluna, Greven, Germany
Seller rating 5 out of 5 stars
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuab. Seller Inventory # 446949426
Buy New
£ 111.93
£ 41.99 shipping
Ships from Germany to U.S.A.
Ships from Germany to U.S.A.
Quantity: Over 20 available