Thin Film Materials: Stress, Defect Formation and Surface Evolution - Hardcover

Freund, L. B.; Suresh, S.

Hardcover

ISBN 10: 0521822815 ISBN 13: 9780521822817

Publisher: Cambridge University Press, 2004

Synopsis

Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation, surface evolution and allied effects in thin film materials. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described. Theoretical concepts are underpinned by discussions on experimental methodology and observations. Fundamental scientific concepts are embedded through sample calculations, a broad range of case studies with practical applications, thorough referencing, and end of chapter problems. With solutions to problems available on-line, this book will be essential for graduate courses on thin films and the classic reference for researchers in the field.

About this title

About the Authors

L. Ben Freund is the Henry Ledyard Goddard University Professor in the Division of Engineering at Brown University.

Subra Suresh is the Ford Professor of Engineering and Head of the Department of Materials Science and Engineering, and Professor of Mechanical Engineering at Massachusetts Institute of Technology.

Edition details

• Publisher: Cambridge University Press
• Publication date: 2004
• Language: English
• ISBN 10: 0521822815
• ISBN 13: 9780521822817
• Binding: Hardcover
• Number of pages: 770