Synopsis
An introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts.
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About the Author
Ayahiko Ichimiya is a Professor in the Department of Quantum Engineering, Nagoya University. Philip I. Cohen is a Professor in the Department of Electrical and Computer Engineering, University of Minnesota.
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Reflection High-Energy Electron Diffraction
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Cambridge University Press, 2004
ISBN 10: 0521453739
ISBN 13: 9780521453738
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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction
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ISBN 13: 9780521453738
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Reflection High-Energy Electron Diffraction (Hardcover)
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Cambridge University Press, Cambridge, 2004
ISBN 10: 0521453739
ISBN 13: 9780521453738
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Hardcover. Condition: new. Hardcover. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9780521453738
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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction
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Reflection High-Energy Electron Diffraction
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Condition: New. An introduction to RHEED for beginners plus detailed experimental and theoretical treatments for experts. Num Pages: 366 pages, 217 b/w illus. 5 tables. BIC Classification: TJFD5. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 21. Weight in Grams: 780. . 2004. Illustrated. hardcover. . . . . Seller Inventory # V9780521453738
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Reflection High-Energy Electron Diffraction
Published by
Cambridge University Press, 2004
ISBN 10: 0521453739
ISBN 13: 9780521453738
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Reflection High-Energy Electron Diffraction (Hardcover)
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Cambridge University Press, Cambridge, 2004
ISBN 10: 0521453739
ISBN 13: 9780521453738
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Hardcover. Condition: new. Hardcover. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED for beginners and describes detailed experimental and theoretical treatments for experts, explaining how to analyze RHEED patterns. For beginners the principles of electron diffraction are explained and many examples of the interpretation of RHEED patterns are described. The second part of the book contains detailed descriptions of RHEED theory. The third part applies RHEED to the determination of surface structures, gives detailed descriptions of the effects of disorder, and critically reviews the mechanisms contributing to RHEED intensity oscillations. This unified and coherent account will appeal to both graduate students and researchers in the study of molecular beam epitaxial growth. Reflection high-energy electron diffraction (RHEED) is the analytical tool of choice for characterizing thin films during growth by molecular beam epitaxy, since it is very sensitive to surface structure and morphology. This book serves as an introduction to RHEED and describes detailed experimental and theoretical treatments for experts. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9780521453738
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