X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components (The Cambridge RF and Microwave Engineering Series) - Hardcover

Book 11 of 20: Cambridge RF and Microwave Engineering

Root, David E.; Verspecht, Jan; Horn, Jason; Marcu, Mihai

 
9780521193238: X-Parameters: Characterization, Modeling, and Design of Nonlinear RF and Microwave Components (The Cambridge RF and Microwave Engineering Series)

Synopsis

The definitive guide to X-parameters, written by the original inventors and developers.

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About the Authors

David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011).

Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE.

Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements.

Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.

"About this title" may belong to another edition of this title.