Items related to Focused Ion Beam Systems: Basics and Applications

Focused Ion Beam Systems: Basics and Applications - Softcover

 
9780521158596: Focused Ion Beam Systems: Basics and Applications
Softcover
ISBN 10: 0521158591 ISBN 13: 9780521158596
Publisher: Cambridge University Press, 2011

Synopsis

This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology.

"synopsis" may belong to another edition of this title.

Book Description

This edited volume, first published in 2007, comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

About the Author

NAN YAO holds several positions at Princeton University, New Jersey. He is director of the Imaging and Analysis Center; Senior Research Scholar at the Institute for the Science and Technology of Materials; and a lecturer in Mechanical and Aerospace Engineering.

"About this title" may belong to another edition of this title.

Publisher
Cambridge University Press
Publication date
2011
Language
English
ISBN 10 
0521158591
ISBN 13 
9780521158596
Binding
Paperback
Number of pages
408
Editor
Yao Nan