ESD in Silicon Integrated Circuits: An Introduction to Device Physics and Protection (Design And Measurement in Electronic Engineering) - Hardcover

Amerasekera, E. Ajith; Duvvury, Charvaka

Hardcover

ISBN 10: 0471954810 ISBN 13: 9780471954811

Publisher: Wiley–Blackwell, 1995

Synopsis

This detailed study explains the practical aspects of electrostatic discharge (ESD) and its implications in the design and development of new technologies and integrated circuits. It opens with an introductory overview of ESD and its importance to the semiconductor industry. All aspects of ESD are explored in detail, ranging from physics and circuit design to the effects of processing and packaging and the relatively new field of modelling for ESD studies. There is a concentration upon the key issue of reliability and test methods to assess protection circuit performance. Various case studies are employed to illustrate the effects of different design approaches and the full effectiveness of a protection circuit is realized through stress analysis. The book concludes with a summary of the state-of-the-art protection techniques and a look towards the future developments in ESD.

About this title

From the Back Cover

Electrostatic Discharge (ESD) effects in silicon integrated circuits have become a major concern as today's high circuit density technologies shrink to sub-micro dimensions. This book provides an understanding of the basic features related to ESD and deals with topics ranging from the physics of devices operating under ESD conditions to approaches for solving and improving ESD performance in advanced ICs. Features include:
* Description of the methods used to reproduce ESD-type events in a controlled test environment
* Analysis of the behavior of different semiconductor devices under ESD conditions, including the physics and modeling of devices
* Detailed study of design and layout requirements for ESD protection circuits
* Case studies showing examples of approaches to solving ESD design problems, including failure analysis
Covering the state-of-the-art in circuit design for ESD prevention, this practical book is written from an industrial perspective and will appeal to engineers and scientists working in the fields of IC and transistor design. Researchers and advanced students in the fields of device/circuit modeling and semiconductor reliability, seeking to understand the fundamentals of ESD phenomena, will also find this book an invaluable reference source.

Edition details

• Publisher: Wiley–Blackwell
• Publication date: 1995
• Language: English
• ISBN 10: 0471954810
• ISBN 13: 9780471954811
• Binding: Hardcover
• Number of pages: 224