Items related to Testing Semiconductor Memories
Synopsis
Comprehensive coverage of memory test problems at chip, array and board level is provided in this book. For each of these test levels a class of fault models is introduced along with tests for these models. The author also presents algorithms of relevant fault models, together with proofs of their correctness. Special attention is given to why a fault model belongs to a particular class and why it is of interest. A software package, suitable for use on IBM PCs and compatibles,is also available which consists of a set of memory test programs and a simulation package demonstrating how the algorithms are executed and the relationship of the algorithm with the memory.
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Testing Semiconductor Memories: Theory and Practice
Seller: Austin Goodwill 1101, Austin, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: good. Book shows general signs of use and handling. May have light wear on the cover or edges and minimal writing or highlighting. Binding remains tight, and pages are clean and readable. Seller Inventory # CTXV.0471925861.G
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Testing Semiconductor Memories : Theory and Practice
Published by
Wiley & Sons, Incorporated, John, 1991
ISBN 10: 0471925861
ISBN 13: 9780471925866
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Hardcover
Seller: Better World Books: West, Reno, NV, U.S.A.
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Condition: Very Good. Former library copy. Pages intact with possible writing/highlighting. Binding strong with minor wear. Dust jackets/supplements may not be included. Includes library markings. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good. Seller Inventory # 39598237-6
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Testing Semiconductor Memories: Theory and Practice
Seller: GoldBooks, Denver, CO, U.S.A.
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Hardcover. Condition: new. New Copy. Customer Service Guaranteed. Seller Inventory # 39W79_91_0471925861
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Testing Semiconductor Memories: Theory and Practice
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.
Seller rating 5 out of 5 stars
hardcover. Condition: New. In shrink wrap. Looks like an interesting title! Seller Inventory # Q-0471925861
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Testing Semiconductor Memories: Theory and Practice
Published by
Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1991
ISBN 10: 0471925861
ISBN 13: 9780471925866
Used
Hardcover
First Edition
Seller: Bingo Books 2, Vancouver, WA, U.S.A.
Seller rating 4 out of 5 stars
Hardcover. Condition: Near Fine. No Jacket. 1st Edition. hardback book in near fine condition,motorola-employee name at top of first blank page. Seller Inventory # 85700