Synopsis
The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.
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About the Author
T. P. Ma and Paul V. Dressendorfer are the authors of Ionizing Radiation Effects in MOS Devices and Circuits, published by Wiley.
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Ionizing Radiation Effects in MOS Devices and Circuits
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Ionizing Radiation Effects in MOS Devices and Circuits (Hardcover)
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ISBN 10: 047184893X
ISBN 13: 9780471848936
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Hardcover. Condition: new. Hardcover. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9780471848936
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Ionizing Radiation Effects in MOS Devices and Circuits
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Wiley-Interscience, 1989
ISBN 10: 047184893X
ISBN 13: 9780471848936
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Condition: New. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Editor(s): Ma, T. P.; Dressendorfer, Paul V. Num Pages: 608 pages, Ill. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 168 x 37. Weight in Grams: 1006. . 1989. 1st Edition. hardcover. . . . . Seller Inventory # V9780471848936
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Ionizing Radiation Effects in MOS Devices and Circuits
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Condition: New. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Editor(s): Ma, T. P.; Dressendorfer, Paul V. Num Pages: 608 pages, Ill. BIC Classification: TJFC. Category: (P) Professional & Vocational; (UP) Postgraduate, Research & Scholarly. Dimension: 244 x 168 x 37. Weight in Grams: 1006. . 1989. 1st Edition. hardcover. . . . . Books ship from the US and Ireland. Seller Inventory # V9780471848936