The fourth edition features coverage of cutting edge topics––more advanced CMOS device electronics to include short–channel effects, weak inversion and impact ionization. In this resourceful book find: ∗ Coverage of state–of–the–art IC processes shows how modern integrated circuits are fabricated, including recent issues like heterojunction bipolar transistors, copper interconnect and low permittivity dielectric materials ∗ Comprehensive and unified treatment of bipolar and CMOS circuits helps readers design real–world amplifiers in silicon.
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"Intended both for students and as a reference for working engineers, the fifth edition of this popular engineering textbook is updated to include discussions of newly available integrated circuits as well as general advances in the field. Drawn from material taught to high level seniors and graduate students at the University of California′s Berkeley and Davis engineering departments, the work covers such topics as the physics of bipolar and MOS transistors, the technology of integrated circuit (IC) fabrication and the design and uses of operational amplifiers as well as many advanced topics in IC principles and design." ( Reference and Research Book News, February 2011)
THE CLASSIC APPROACH TO CUTTING–EDGE ANALYSIS AND DESIGN
In this Fourth Edition of ANALYSIS AND DESIGN OF ANALOG INTEGRATED CIRCUITS, Paul Gray and Robert Meyer have teamed up with two new coauthors–Paul Hurst and Stephen Lewis–to provide a current, comprehensive and in–depth treatment of analog integrated circuit analysis and design. The authors combine bipolar, CMOS, and BICMOS analog integrated–circuit design into a unified presentation that stresses their commonalties and highlights their differences. Readers will gain valuable insights into the relative strengths and weaknesses of these important technologies.
The Fourth Edition features new and expanded coverage of several key technologies and techniques, including increased emphasis on CMOS circuits in Chapters 3–7; a new chapter covering fully differential amplifiers and common–mode feedback circuit analysis using return ration in addition to the two–part feedback analysis; and new coverage of two–stage MOS op–amp compensation, single–stage op amps, and nested Miller compensation.
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