Semiconductor Material and Device Characterization (IEEE Press) - Hardcover

Schroder, Dieter K.

Hardcover

ISBN 10: 0471739065 ISBN 13: 9780471739067

Publisher: Wiley-IEEE Press, 2006

Synopsis

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition , including: Updated and revised...

About this title

Review:

"The book is well-illustrated and provides an ample bibliography." (Optics & Photonics News, 4 November 2015)

"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)

About the Author:

DIETER K. SCHRODER, PhD, is Professor, Department of Electrical Engineering, Arizona State University. He is a recipient of the ASU College of Engineering Teaching Excellence Award and several other teaching awards. In addition to Semiconductor Material and Device Characterization, Dr. Schroder is the author of Advanced MOS Devices.

About this edition

• Publisher: Wiley-IEEE Press
• Publication date: 2006
• ISBN 10: 0471739065
• ISBN 13: 9780471739067
• Binding: Hardcover
• Edition number: 3
• Number of pages: 800