Digital Logic Testing and Simulation - Softcover

Miczo, Alexander

Softcover

ISBN 10: 047161307X ISBN 13: 9780471613077

Publisher: John Wiley & Sons, 1988

Synopsis

Digital electronics has been the object of a major revolution. Circuits are shrinking in physical size while growing both in their speed and in their range of capabilities. Along with this revolution in hardware, there is a corresponding revolution in the software programs provided with the computer. This rapid advancement is not without its problems, a major one of which is testing. Because of the testing problems arising from the increasing complexity of these devices, new test strategies are emerging. Increasing emphasis is being placed on finding a defect as early as possible in the manufacturing cycle, new algorithms are being devised to create tests for logic circuits, and more attention is being given to design-for-test techniques that require active participation by the logic designers. The first six chapters of this book are concerned with traditional approaches for generating stimuli and applying them to circuits. In Chapter 7 attention is focused on methods for designing testable logic and in Chapter 8 the author looks at some algorithms designed to take advantage of the regularity of memories. In the final chapters, trends and research are examined from different perspectives.

About this title

Review

"...well–written and covers broad subjects related to the test of digital circuits. It will be useful for students and engineers involved in design and testing." ( IEEE Circuits & Devices Magazine, July/August 2005)

This is an excellent introduction to testing digital circuits...valuable to IC design and product engineers, and stands as an excellent academic reference for electrical engineering students. (Chip Scale Review, March 2004)

From the Back Cover

Your road map for meeting today’s digital testing challenges

Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge.

There is no single solution to the testing problem. Organized in an easy–to–follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as:

• Binary Decision Diagrams (BDDs) and cycle–based simulation
• Tester architectures/Standard Test Interface Language (STIL)
• Practical algorithms written in a Hardware Design Language (HDL)
• Fault tolerance
• Behavioral Automatic Test Pattern Generation (ATPG)
• The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach

Up–to–date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability.

Edition details

• Publisher: John Wiley & Sons
• Publication date: 1988
• ISBN 10: 047161307X
• ISBN 13: 9780471613077
• Binding: Paperback
• Language: English
• Number of pages: 414