Handbook of Monochromatic XPS Spectra: Polymers and Polymers Damaged by X-Rays: 002 - Hardcover

Crist, B. Vincent

 
9780471492672: Handbook of Monochromatic XPS Spectra: Polymers and Polymers Damaged by X-Rays: 002
Hardcover
ISBN 10: 0471492671 ISBN 13: 9780471492672
Publisher: Wiley, 2000

Synopsis

Contains an invaluable collection of research grade XPS spectra, including comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported.
* Presents XPS spectra from pure polymers and X-ray induced damage studies of polymers
* Vertical and horizontal differential charging effects have been eliminated by using the flood-gun-mesh-screen system
* All spectra were obtained under everyday conditions, allowing users to compare directly with in-house spectra
* Self-consistent methodology that maximises reliablility and minimizes errors
* Overlays of high resolution spectra before and after long-term exposure to monochromatic X-rays
* Valence band spectra of pure polymers which serve as material fingerprints

"synopsis" may belong to another edition of this title.

About the Author

B. Vincent Crist XPS International, Ames, Iowa

From the Back Cover

This handbook is one of three containing an invaluable collection of research grade XPS spectra. Each handbook concentrates on a specific family of materials (the elements and their native oxides, semiconductors, and polymers) and is entirely self-contained. The introductory section to each handbook includes comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported. Among the many valuable features included in each of these handbooks are:
* All spectra were measured by using Al_K monochromatic X-rays.
* All spectra were collected in a self-consistent manner to maximize data reliability and quality.
* All peaks in the wide spectra are fully annotated and accompanied by detailed atom % tables that report BEs for each of the labelled peaks.
* Each high-energy resolution spectrum is peak-fitted and accompanied by detailed tables containing binding energies, FWHMs and relative percentages.
In this volume, Polymers and Polymers Damaged by X-rays, are contained XPS spectra from pure polymers and X-ray-induced damage studies of polymers that are valuable when researching the true shape of polymer spectra free of any X-ray- or heat-induced damage. Exclusive features of this volume include:
* Vertical and horizontal differential charging effects have been eliminated by using the flood-gun-mesh-screen system
* All spectra were obtained under everyday conditions, allowing users to compare directly with in-house spectra
* Self-consistent methodology that maximizes reliability and minimizes errors
* Overlays of high resolution spectra before and after long-term exposure to monochromatic X-rays
* Valence band spectra of pure polymers which serve as material fingerprints.
This handbook is an invaluable reference for scientists in industry, academia and government laboratories that use XPS spectra in materials science, polymer science and surface science. Also available: Handbook of Monochromatic XPS Spectra: The Elements and Native Oxides Handbook of Monochromatic XPS Spectra: Semiconductors

From the Inside Flap

This handbook is one of three containing an invaluable collection of research grade XPS spectra. Each handbook concentrates on a specific family of materials (the elements and their native oxides, semiconductors, and polymers) and is entirely self-contained. The introductory section to each handbook includes comprehensive information about the XPS instruments used, the materials, and the advanced methods of collecting the spectra. Energy resolution settings, instrument characteristics, energy referencing methods, traceability, energy scale calibration details and transmission function are all reported. Among the many valuable features included in each of these handbooks are:
* All spectra were measured by using Al_K monochromatic X-rays.
* All spectra were collected in a self-consistent manner to maximize data reliability and quality.
* All peaks in the wide spectra are fully annotated and accompanied by detailed atom % tables that report BEs for each of the labelled peaks.
* Each high-energy resolution spectrum is peak-fitted and accompanied by detailed tables containing binding energies, FWHMs and relative percentages.
In this volume, Polymers and Polymers Damaged by X-rays, are contained XPS spectra from pure polymers and X-ray-induced damage studies of polymers that are valuable when researching the true shape of polymer spectra free of any X-ray- or heat-induced damage. Exclusive features of this volume include:
* Vertical and horizontal differential charging effects have been eliminated by using the flood-gun-mesh-screen system
* All spectra were obtained under everyday conditions, allowing users to compare directly with in-house spectra
* Self-consistent methodology that maximizes reliability and minimizes errors
* Overlays of high resolution spectra before and after long-term exposure to monochromatic X-rays
* Valence band spectra of pure polymers which serve as material fingerprints.
This handbook is an invaluable reference for scientists in industry, academia and government laboratories that use XPS spectra in materials science, polymer science and surface science. Also available: Handbook of Monochromatic XPS Spectra: The Elements and Native Oxides Handbook of Monochromatic XPS Spectra: Semiconductors

"About this title" may belong to another edition of this title.

Publisher
Wiley
Publication date
2000
Language
English
ISBN 10 
0471492671
ISBN 13 
9780471492672
Binding
Hardcover
Edition number
1
Number of pages
454