CMOS Electronics: How It Works, How It Fails - Hardcover

Segura, Jaume; Hawkins, Charles F.

Hardcover

ISBN 10: 0471476692 ISBN 13: 9780471476696

Publisher: Wiley-IEEE Press, 2004

Synopsis

CMOS manufacturing environments are surrounded with symptoms that can indicate serious test, design, or reliability problems, which, in turn, can affect the financial as well as the engineering bottom line. This book educates readers, including non-engineers involved in CMOS manufacture, to identify and remedy these causes. This book instills the electronic knowledge that affects not just design but other important areas of manufacturing such as test, reliability, failure analysis, yield-quality issues, and problems.

Designed specifically for the many non-electronic engineers employed in the semiconductor industry who need to reliably manufacture chips at a high rate in large quantities, this is a practical guide to how CMOS electronics work, how failures occur, and how to diagnose and avoid them.

Key features:

• Builds a grasp of the basic electronics of CMOS integrated circuits and then leads the reader further to understand the mechanisms of failure.
• Unique descriptions of circuit failure mechanisms, some found previously only in research papers and others new to this publication.
• Targeted to the CMOS industry (or students headed there) and not a generic introduction to the broader field of electronics.
• Examples, exercises, and problems are provided to support the self-instruction of the reader.

About this title

About the Author

JAUME SEGURA, PhD, is an Associate Professor of Electrical Engineering at the Balearic Islands University, Spain, where he has been a member of the faculty since 1993. He has been a visiting researcher at Philips Semiconductors and Intel Corporation, working on design and test issues. He is a member of the IEEE, the Chairman of the IEEE-CAS Spanish Chapter, and serves on the technical program committees of such conferences as ITC, DATE, and VTS.

CHARLES F. HAWKINS, PhD, is a Professor of Electrical Engineering at the University of New Mexico at Albuquerque, where he has been a member of the faculty since 1972. He is also a research contract engineer with the Sandia National Laboratories IC Group and has consulted with Intel Corporation, AMD Corporation, and Philips Research Labs on issues of quality, reliability, testability research, and testing. Professor Hawkins is a Member of IEEE and a member of the Electronic Device Failure Analysis Society (EDFAS) of ASM, as well as the editor of EDFAS Magazine. Professor Hawkins frequently teaches short courses and industrial seminars to leading chip manufacturers worldwide.

From the Back Cover

Get a better understanding of how CMOS circuits work and, more importantly, how they fail!

CMOS manufacturing environments are rife with symptoms that can indicate serious test, design, or reliability problems. CMOS Electronics: How It Works, How It Fails provides both practitioners and students in the industry with the electronic knowledge that relates not just to the design of a product, but other important aspects of manufacturing such as testing, reliability, failure analysis, yield-quality issues, and common problems that may occur during production.

The majority of those who work in the CMOS integrated circuit (IC) industry have educational backgrounds other than electrical engineering. The first part of the book assumes little knowledge of circuitry and transistors, covering the relevant basic electronics of CMOS ICs at a tutorial level or as a quick review for electrical engineers. The second half offers thorough descriptions of failure mechanisms that both audiences can appreciate.

A valuable addition to the CMOS literature, CMOS Electronics addresses such common questions as:

• Is the symptom an outcome of random defects, or is it symptomatic with a common failure signature?
• Why doesn t my test program detect certain defects?
• Are my test escapes a reliability problem?
• Is the defect a bridging problem, an open circuit problem, or a subtle speed-related problem?

Providing rapid guidance to the nature of these problems and offering unique descriptions of many circuit failure mechanisms found previously only in research papers, CMOS Electronics is an essential text for practitioners in the CMOS industry, or students headed there.

CMOS manufacturing environments are rife with symptoms that can indicate serious test, design, or reliability problems. CMOS Electronics: How It Works, How It Fails provides both practitioners and students in the industry with the electronic knowledge that relates not just to the design of a product, but other important aspects of manufacturing such as testing, reliability, failure analysis, yield-quality issues, and common problems that may occur during production.

The majority of those who work in the CMOS integrated circuit (IC) industry have educational backgrounds other than electrical engineering. The first part of the book assumes little knowledge of circuitry and transistors, covering the relevant basic electronics of CMOS ICs at a tutorial level or as a quick review for electrical engineers. The second half offers thorough descriptions of failure mechanisms that both audiences can appreciate.

A valuable addition to the CMOS literature, CMOS Electronics addresses such common questions as:

• Is the symptom an outcome of random defects, or is it symptomatic with a common failure signature?
• Why doesn’t my test program detect certain defects?
• Are my test escapes a reliability problem?
• Is the defect a bridging problem, an open circuit problem, or a subtle speed-related problem?

Providing rapid guidance to the nature of these problems and offering unique descriptions of many circuit failure mechanisms found previously only in research papers, CMOS Electronics is an essential text for practitioners in the CMOS industry, or students headed there.

Edition details

• Publisher: Wiley-IEEE Press
• Publication date: 2004
• Language: English
• ISBN 10: 0471476692
• ISBN 13: 9780471476696
• Binding: Hardcover
• Edition number: 1
• Number of pages: 366