The classic reference on the theory and application of random data analysis-now expanded and revised. This eagerly awaited new edition of the bestselling random data analysis book continues to provide first-rate, practical tools for scientists and engineers who investigate dynamic data as well as those who use statistical methods to solve engineering problems. It is fully updated, covering new procedures developed since 1986 and extending the discussion to a remarkably broad range of applied fields, from aerospace and automotive industries to biomedical research. Comprehensive and self-contained, this new edition also greatly expands coverage of the theory, including derivations of key relationships in probability and random process theory not usually found in books of this kind. Special features of Random Data: Analysis and Measurement Procedures, Third Edition include: Basic probability functions for level crossings and peak values of random data Complete derivations of both old and new practical formulas for statistical error analysis of computed estimates The latest methods for data acquisition and processing as well as nonstationary data analysis Additional techniques on digital data analysis procedures New material on the analysis of multiple-input/multiple-output linear systems Numerous new examples and problem sets Hundreds of updated illustrations and references
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"...can be recommended for practical working engineers and scientists to support their daily work, as well as for university readers as a teaching textbook in advanced courses" -- Measurement Science & Technology, December 2000
"The book is a good practical reference for working engineers an scientists in many fields." -- Zentralblett Math, April 2001
JULIUS S. BENDAT, PhD, is President of the J. S. Bendat Company and the author of Nonlinear System Techniques and Applications (available from Wiley). ALLAN G. PIERSOL, PE, is President of Piersol Engineering Company and the author of several chapters in engineering handbooks. The authors have previously collaborated on the companion volume to this book, Engineering Applications of Correlation and Spectral Analysis, Second Edition, also available from Wiley.
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