Characterization of Materials: 2 Volume Set - Hardcover

Hardcover

ISBN 10: 0471268828 ISBN 13: 9780471268826

Publisher: Wiley–Blackwell, 2003

Synopsis

"Characterization of Materials" (formerly "Methods in Materials Research") provides comprehensive up-to-date coverage of materials characterization techniques, including computational and theoretical methods as well as crystallography, mechanical testing, thermal analysis, optical imaging and spectroscopy, and more. Editor-in-Chief, Elton Kaufmann, Ph.D. is Associate Director of the Strategic Planning Group at the Argonne National Laboratory and has published approximately 100 technical papers in refereed journals and books. Dr. Kaufmann has assembled leading experts from academia, government, and industry to provide: a comprehensive up-to-date collection of methods used in the characterization of materials; articles on various methods from standard to cutting edge; periodic online updates to keep pace with latest developments; and a user-friendly format that is easy and simple to search and navigate. "Characterization of Materials" is a collection of characterization methods that is widely applicable in the wide and diverse field of materials research irrespective of discipline or ultimate application and with which researchers, engineers, and educators must have familiarity. Methods covered include: General Vacuum Techniques; X-Ray Powder Diffraction; High Strain Rate Testing; Deep Level Transient Spectroscopy; Cyclic Voltammetry; Extended X-Ray Absorption Fine Structure; Low Energy Electron Diffraction; Thermogravimetric Analysis; Magnetometry; Transmission Electron Microscopy; and Ultraviolet Photoelectron Spectroscopy. This reference work is also available as a convenient online edition.

About this title

About the Author

Dr. Kaufmann is Associate Director of the Strategic Planning Group at the Argonne National Laboratory, Argonne, Illinois. He is concurrently a physicist with the Materials Science Division at Argonne. He has been with Argonne since 1989 and has served in several positions. Dr. Kaufmann holds a B.Sc. in Physics from the Rensselaer Polytechnic Institute, Troy, New York and a Ph.D. from California Institute of Technology, Pasadena, California, where he was also a Post-Doctoral Research Assistant. Prior to joining Argonne, Dr. Kaufmann was with Lawrence Livermore National Laboratory, Livermore, California in the Chemistry and Materials Science Department as a Division Leader of Materials, and he was also with the Bell Telephone Laboratories, Murray Hill, New Jersey as a member of the Radiation Physics Research Department. Dr. Kaufmann is a member of the Materials Research Society in which he held several positions including President (1985). He is also a member of The Minerals, Metals and Materials Society, the American Association for the Advancement of Science, as well as a Fellow of the American Physical Society. He was Program Chair/Organizer of the Joint ISTEC/MRS International Workshops on High Temperature Superconductivity 5 times, Secretary of the International Union of Materials Research Societies (2001-2002), Chair of the Commission on Publications of the International Union of Materials Research Societies (1998-present), and Executive Editor of the periodical IUMRS Facets among other activities. Dr. Kaufmann has published approximately 100 technical papers in refereed journals and books and has served as co-editor of two proceeding volumes. His Avocations are writing, editing, and fine art photography.

From the Back Cover

Characterization of Materials (formerly Methods in Materials Research) provides comprehensive up-to-date coverage of materials characterization techniques including computational and theoretical methods as well as crystallography, mechanical testing, thermal analysis, optical imaging and spectroscopy, and more.

Editor-in-Chief, Elton Kaufmann, Ph.D. is Associate Director of the Strategic Planning Group at the Argonne National Laboratory and has published approximately 100 technical papers in refereed journals and books.

Dr. Kaufmann has assembled leading experts from academia, government, and industry to provide:

• A comprehensive up-to-date collection of methods used in the characterization of materials
• Articles on various methods from standard to cutting edge
• Periodic online updates to keep pace with latest developments
• A user-friendly format that is easy and simple to search and navigate

Characterization of Materials is a collection of characterization methods that is widely applicable in the wide and diverse field of materials research irrespective of discipline or ultimate application and with which researchers, engineers, and educators must have familiarity.

Methods covered include:

• General Vacuum Techniques
• X-Ray Powder Diffraction
• High Strain Rate Testing
• Deep Level Transient Spectroscopy
• Cyclic Voltammetry
• Extended X-Ray Absorption Fine Structure
• Low Energy Electron Diffraction
• Thermogravimetric Analysis
• Magnetometry
• Transmission Electron Microscopy
• Ultraviolet Photoelectron Spectroscopy

This reference work is also available as a convenient online edition. For information regarding the online edition, please visit: www.mrw.interscience.wiley.com/com

Edition details

• Publisher: Wiley–Blackwell
• Publication date: 2003
• Language: English
• ISBN 10: 0471268828
• ISBN 13: 9780471268826
• Binding: Hardcover
• Number of pages: 1392
• Editor: Kaufmann Elton N.