Statistical Regression with Measurement Error: Kendall's Library of Statistics 6 - Hardcover

Cheng, Chi-Lun; Van Ness, John W.

 
9780470711064: Statistical Regression with Measurement Error: Kendall's Library of Statistics 6
Hardcover
ISBN 10: 047071106X ISBN 13: 9780470711064
Publisher: Wiley, 1999

Synopsis

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.

"synopsis" may belong to another edition of this title.

About the Author

Chi-Lun Cheng and John W. Van Ness are the authors of Statistical Regression with Measurement Error: Kendall's Library of Statistics 6, published by Wiley.

"About this title" may belong to another edition of this title.

Publisher
Wiley
Publication date
1999
Language
English
ISBN 10 
047071106X
ISBN 13 
9780470711064
Binding
Hardcover
Edition number
1
Number of pages
282

Other Popular Editions of the Same Title

9780340614617: Statistical Regression with Measurement Error: Kendall′s Library of Statistics 6: No. 6

Featured Edition

ISBN 10:  0340614617 ISBN 13:  9780340614617
Publisher: Wiley–Blackwell, 1999
Hardcover