Synopsis
A distinctive feature of modern computer equipment development is the continuous increase in functionality and complexity of computer components. As a result of these advances, very large-scale integration (VLSI) circuits have found extensive application in the manufacture of computer products, personal computers included. Among a variety of recently evolved VLSI design technologies, the self-test VLSI design has gained particular prominence. The present study provides a current review on the problems of self-test VLSI design. A summary is given on self-test VLSI design results that have been obtained by scientists in leading scientific centres for computer integrated circuits. Emphasis is placed on the theoretical fundamentals of designing self-test VLSI building blocks, such as built-in test generators and output response analyzers. Particular attention is paid to: structural design of self-test VLSI circuits; design of universal modules for self-test VLSI circuits; and examination of the VLSI circuits for signature testability. It has been demonstrated that the design-for-testability techniques employed by this method provide ideal conditions for the straightforward implementation of self-test concepts. The work should prove useful for all those interested in both the basic facts and current research in this field.
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Self-Testing VLSI Design
Seller: PsychoBabel & Skoob Books, Didcot, United Kingdom
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hardcover. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. No dust jacket, name from previous owner on FEP. Binding is very well preserved, though with very light instances of wear to surfaces (a cosmetic problem and not a functional one). Inside, pages are clean and crisp, and printing is tight, clean and bright throughout. MB. Used. Seller Inventory # 248088
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