Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7) - Hardcover
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Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7)
Seller: Ammareal, Morangis, France
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Hardcover. Condition: Bon. Ancien livre de bibliothèque. Edition 1973. Tome 7. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 1973. Volume 7. Ammareal gives back up to 15% of this item's net price to charity organizations. Seller Inventory # E-595-602
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Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7)
Seller: Mispah books, Redhill, SURRE, United Kingdom
Seller rating 4 out of 5 stars
hardcover. Condition: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book. Seller Inventory # ERICA82904441046233
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