Microelectronics Manufacturing Diagnostics Handbook (Electrical Engineering) - Hardcover

Landzberg, Abraham

Hardcover

ISBN 10: 0442004710 ISBN 13: 9780442004712

Publisher: Springer, 1992

Synopsis

The world of microelectronics is filled with cusses measurement systems, manufacturing many success stories. From the use of semi­ control techniques, test, diagnostics, and fail­ ure analysis. It discusses methods for modeling conductors for powerful desktop computers to their use in maintaining optimum engine per­ and reducing defects, and for preventing de­ formance in modem automobiles, they have fects in the first place. The approach described, clearly improved our daily lives. The broad while geared to the microelectronics world, has useability of the technology is enabled, how­ applicability to any manufacturing process of similar complexity. The authors comprise some ever, only by the progress made in reducing their cost and improving their reliability. De­ of the best scientific minds in the world, and fect reduction receives a significant focus in our are practitioners of the art. The information modem manufacturing world, and high-quality captured here is world class. I know you will diagnostics is the key step in that process. find the material to be an excellent reference in of product failures enables step func­ Analysis your application. tion improvements in yield and reliability. which works to reduce cost and open up new Dr. Paul R. Low applications and technologies. IBM Vice President and This book describes the process ofdefect re­ of Technology Products General Manager duction in the microelectronics world.

About this title

Synopsis

This handbook is a practical guide to achieving higher manufacturing yields and greater product reliability. Demonstrating how to put a cap on skyrocketing manufacturing costs, the book reveals ways to pinpoint and quickly correct the defects that reduce overall manufacturing yield. Packed with methods and procedures, this reference should help solve the toughest electronic manufacturing problems. The book includes a variety of techniques, including process monitoring, inspection, electrical testing, failure analysis, and reliability testing for identifying and isolating stubborn deviations; a spectrum of diagnostic approaches - from the simplest bar code reader used in creating manufacturing traceability - to the most sophisticated analysis technique for identifying the origin of surface contaminants; up-to-date coverage of process modeling and artificial intelligence; and several sections devoted exclusively to solving non-semiconductor manufacturing problems.

Edition details

• Publisher: Springer
• Publication date: 1992
• Language: English
• ISBN 10: 0442004710
• ISBN 13: 9780442004712
• Binding: Hardcover
• Number of pages: 666