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Synopsis
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
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From the Back Cover
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
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Scanning Probe Microscopy: Electrical And Electromechanical Phenomena At The Nanoscale, 2 Volumes Set
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Scanning Probe Microscopy: Electrical And Electromechanical Phenomena At The Nanoscale, 2 Volumes Set
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Scanning Probe Microscopy: Electrical And Electromechanical Phenomena At The Nanoscale, 2 Volumes Set
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Scanning Probe Microscopy: Electrical And Electromechanical Phenomena At The Nanoscale, 2 Volumes Set
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Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale, 2 Volume Set
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Scanning Probe Microscopy
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Scanning Probe Microscopy
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Scanning Probe Microscopy
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Scanning Probe Microscopy
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Appeals to researchers from disciplines as diverse as physics, chemistry, biology, molecular engineering and biotechnologyPresents practical aspects of materials characterization as applied to semiconductors, ferroelectrics, dielectrics, polymers,. Seller Inventory # 5909735
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Scanning Probe Microscopy
Published by
Springer New York Dez 2006, 2006
ISBN 10: 0387286675
ISBN 13: 9780387286679
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Hardcover
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This volume will be devoted to the technical aspects of electrical and electromechanical SPM probes and SPM imaging on the limits of resolution, thus providing technical introduction into the field. This volume will also address the fundamental physical phenomena underpinning the imaging mechanism of SPMs. 1040 pp. Englisch. Seller Inventory # 9780387286679