Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM - Hardcover

Egerton, R.F.

Hardcover

ISBN 10: 0387258000 ISBN 13: 9780387258003

Publisher: Springer-Verlag New York Inc., 2005

Synopsis

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

About this title

From the Back Cover

Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Edition details

• Publisher: Springer-Verlag New York Inc.
• Publication date: 2005
• Language: English
• ISBN 10: 0387258000
• ISBN 13: 9780387258003
• Binding: Hardcover
• Edition number: 1
• Number of pages: 214