Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972 (Classic Reprint) - Hardcover
Synopsis
Excerpt from Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972
Key wards: Aluminum wire; base transit time; carrier lifetime; die attach ment; electrical properties; epitaxial silicon; gamma - ray detectors; gen eration centers; germanium; gold-doped silicon; infrared response; methods of measurement; microelectronics; microwave diodes; nuclear radiation de tectors; probe techniques (aéc); recombination centers; resistivity; ribbon wire bonding; semiconductor devices; semiconductor materials; semiconductor process control; silicon; thermal resistance; trapping centers; ultrasonic bonding; wire bonds.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, July 1 to September 30, 1972 Classic Reprint
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, July 1 to September 30, 1972 Classic Reprint
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780332767666
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