Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers - Softcover

9780323282017: Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers

Softcover

ISBN 10: 0323282016 ISBN 13: 9780323282017

Publisher: Academic Press, 2014

Advances in Imaging and Electron Physics merges two long-running serials- Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the university of Cambridge, whre he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Optical Society of America. He is a member of the editorial boards of several microscopy journals.

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