Scanning Electron Microscopy and X-ray Microanalysis: A Text for Biologists, Materials Scientists and Geologists - Hardcover

Goldstein, Joseph I.; Newbury, Dale E.; Echlin, Patrick; Joy, D. C.

Hardcover

ISBN 10: 0306441756 ISBN 13: 9780306441752

Publisher: Kluwer Academic / Plenum Publishers, 1992

Synopsis

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop­ ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.

About this title

Review:

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal

Synopsis:

A hefty text, substantially revised (first edition, 1981), introduces the topic, with an emphasis on practical aspects of the techniques described. Basic material is highlighted to aid newcomers. A new chapter covers quantitative X-ray microanalysis of bulk samples. Annotation copyright Book News, Inc. Portland, Or.

About this edition

• Publisher: Kluwer Academic / Plenum Publishers
• Publication date: 1992
• ISBN 10: 0306441756
• ISBN 13: 9780306441752
• Binding: Hardcover
• Edition number: 2
• Number of pages: 800