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Synopsis
Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals.
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Synopsis
The first of two volumes in the series containing descriptions of the techniques and methods of electron and ion spectroscopies which are in widespread use for surface analysis. The focus is on techniques for which commercial instrumentation is available, and the intent is to fill the gap between manufacturers' handbooks and review articles. For ea
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Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization, 2)
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Ion Spectroscopies for Surface Analysis
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Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization, 2)
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Ion Spectroscopies for Surface Analysis
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SPRINGER NATURE Sep 1991, 1991
ISBN 10: 0306437929
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Determining the elemental composition of surfaces is an essential measurement in characterizing solid surfaces. At present, many ap proaches may be applied for measuring the elemental and molecular composition of a surface. Each method has particular strengths and limitations that often are directly connected to the physical processes involved. Typically, atoms and molecules on the surface and in the near surface region may be excited by photons, electrons, ions, or neutrals, and the detected particles are emitted, ejected, or scattered ions or electrons. The purpose of this book is to bring together a discussion of the surface compositional analysis that depends on detecting scattered or sputtered ions, and the methods emphasized are those where instruments are commercially available for carrying out the analysis. For each topic treated, the physical principles, instrumentation, qualitative analysis, artifacts, quantitative analysis, applications, opportunities, and limita tions are discussed. The first chapter provides an overview of the role of elemental composition in surface science; compositional depth profiling; stimulation by an electric field, electrons, neutrals, or photons and detection of ions; and then stimulation by ions, and detection of ions, electrons, photons, or neutrals. 469 pp. Englisch. Seller Inventory # 9780306437922
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Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization, 2)
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Ion Spectroscopies for Surface Analysis
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Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization, 2)
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Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization, 2)
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