The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.
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Describes methods of assessing the quality and reliability of VLSICs (very large scale integrated circuits) using sensitive, non-destructive, electrical measurements. A selection of tests has been devised and evaluated on relatively small scale integrated digital circuits made with CMOS technology. Suggestions are made for the techniques which may
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