Synopsis
The increasing application of integrated circuits in situations where high reliability is needed places a requirement on the manufacturer to use methods of testing to eliminate devices that may fail on service.
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Synopsis
Describes methods of assessing the quality and reliability of VLSICs (very large scale integrated circuits) using sensitive, non-destructive, electrical measurements. A selection of tests has been devised and evaluated on relatively small scale integrated digital circuits made with CMOS technology. Suggestions are made for the techniques which may
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Rapid Reliability Assessment of VLSICs
Seller: BOOKWEST, Phoenix, AZ, U.S.A.
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Hardcover. Condition: New. US SELLER SHIPS FAST FROM USA. Seller Inventory # D-107E1-030643492X-HC-1P3-lb-Ppl-B30
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Rapid Reliability Assessment of VLSICs
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
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Condition: Good. 202 pp., hardcover, ex library, else text and binding still clean tight and bright. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request. Seller Inventory # ZB274906